High-resolution photothermal microscope: A sensitive tool for the detection of isolated absorbing defects in optical coatings

Applied Optics

Volumn 45, Issue 7, 2006, Pages 1410-1415

  Bertussi, Bertrand ^a   Natoli, Jean Yves ^a   Commandré, Mireille ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IMPURITIES; LASER DAMAGE; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; THERMOANALYSIS;

ABSORBING DEFECTS; SPATIAL RESOLUTION; THE PHOTOTHERMAL DEFLECTION TECHNIQUE;

OPTICAL COATINGS;

EID: 33645310635     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.001410     Document Type: Article

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