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Volumn 11, Issue 20, 2003, Pages 2497-2501

Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage

Author keywords

[No Author keywords available]

Indexed keywords

INCLUSIONS; LASER DAMAGE; LASER PULSES; LIGHT ABSORPTION; MULTILAYERS; PHOTOCHEMICAL REACTIONS; SILICA;

EID: 2942755810     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.11.002497     Document Type: Article
Times cited : (33)

References (17)
  • 1
    • 0015614409 scopus 로고
    • Role of cracks, pores, and absorbing inclusions on laser induced damage threshold at surfaces of transparent dielectrics
    • N. Bloembergen, "Role of cracks, pores, and absorbing inclusions on laser induced damage threshold at surfaces of transparent dielectrics," Appl. Opt. 12, 661-664 (1973).
    • (1973) Appl. Opt. , vol.12 , pp. 661-664
    • Bloembergen, N.1
  • 2
    • 0028754066 scopus 로고
    • The role of defects in laser damage of multilayer coatings
    • H.E. Bennett, L. Chase, A.H. Guenther, B.E. Newnam and M.J. Soileau, eds., Proc. SPIE
    • M.R. Kozlowski and R. Chow, "The role of defects in laser damage of multilayer coatings," in Laser-induced damage in optical materials: 1993, H.E. Bennett, L. Chase, A.H. Guenther, B.E. Newnam and M.J. Soileau, eds., Proc. SPIE 2114, 640-649 (1994).
    • (1994) Laser-induced Damage in Optical Materials: 1993 , vol.2114 , pp. 640-649
    • Kozlowski, M.R.1    Chow, R.2
  • 3
    • 58149316379 scopus 로고    scopus 로고
    • Nano absorbing centers : A key point in laser damage of thin films
    • H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam and M.J. Soileau, eds., Proc. SPIE
    • J. Dijon, T. Poiroux and C. Desrumaux, "Nano absorbing centers : A key point in laser damage of thin films," in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam and M.J. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
    • (1997) Laser-induced Damage in Optical Materials: 1996 , vol.2966 , pp. 315-325
    • Dijon, J.1    Poiroux, T.2    Desrumaux, C.3
  • 4
    • 0038115235 scopus 로고    scopus 로고
    • Role of light intensification by cracks in optical breakdown on surfaces
    • F. Y. Genin, A. Salleo, T.V. Pistor and L.L. Chase, "Role of light intensification by cracks in optical breakdown on surfaces," J. Opt. Soc. Am. A 18, 2607-2616 (2001).
    • (2001) J. Opt. Soc. Am. A , vol.18 , pp. 2607-2616
    • Genin, F.Y.1    Salleo, A.2    Pistor, T.V.3    Chase, L.L.4
  • 5
    • 0036602853 scopus 로고    scopus 로고
    • Laser induced damage of materials in bulk, thin films and liquid forms
    • J.Y. Natoli, L. Gallais, H. Akhouayri and C. Amra, "Laser induced damage of materials in bulk, thin films and liquid forms," Appl. Opt. 41, 3156-3166 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 3156-3166
    • Natoli, J.Y.1    Gallais, L.2    Akhouayri, H.3    Amra, C.4
  • 6
    • 0000851767 scopus 로고    scopus 로고
    • Characterization of optical coatings by photothermal deflection
    • M. Cornmandré and P. Roche, "Characterization of optical coatings by photothermal deflection" Appl. Opt. 35, 5021-5034 (1996).
    • (1996) Appl. Opt. , vol.35 , pp. 5021-5034
    • Cornmandré, M.1    Roche, P.2
  • 7
    • 0000687747 scopus 로고
    • Micrometer resolved photothermal displacement inspection of optical coatings
    • E. Welsch and M. Reichling, "Micrometer resolved photothermal displacement inspection of optical coatings," J. Mod. Opt. 40, 1455-1475 (1993).
    • (1993) J. Mod. Opt. , vol.40 , pp. 1455-1475
    • Welsch, E.1    Reichling, M.2
  • 9
    • 0036285293 scopus 로고    scopus 로고
    • Multiscale mapping technique for the simultaneous estimation of absorption and partial scattering in optical coatings
    • A. Gatto and M. Cornmandré, "Multiscale mapping technique for the simultaneous estimation of absorption and partial scattering in optical coatings," Appl. Opt. 41, 225-234 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 225-234
    • Gatto, A.1    Cornmandré, M.2
  • 10
    • 0036603144 scopus 로고    scopus 로고
    • Multi-wavelength imaging of defects in UV optical materials
    • A. During, C. Fossati and M. Commandré, "Multi-wavelength imaging of defects in UV optical materials," Appl. Opt. 41, 3118-3126 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 3118-3126
    • During, A.1    Fossati, C.2    Commandré, M.3
  • 11
    • 0036033566 scopus 로고    scopus 로고
    • Development of a photothermal deflection microscope for multiscale studies of defects
    • G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau and C. J. Stolz, eds., Proc. SPIE
    • A. During, C. Fossati and M. Commandré, "Development of a photothermal deflection microscope for multiscale studies of defects," in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau and C. J. Stolz, eds., Proc. SPIE 4679, 400-409 (2002).
    • (2002) Laser-induced Damage in Optical Materials: 2001 , vol.4679 , pp. 400-409
    • During, A.1    Fossati, C.2    Commandré, M.3
  • 12
    • 0037119610 scopus 로고    scopus 로고
    • Photothermal imaging of nanometer-sized metal particles among scaterrers
    • D. Boyer, P. Tamarat, A. Maali, B. Loumis, M. Orrit, "Photothermal imaging of nanometer-sized metal particles among scaterrers," Science 297, 1160-1163 (2002).
    • (2002) Science , vol.297 , pp. 1160-1163
    • Boyer, D.1    Tamarat, P.2    Maali, A.3    Loumis, B.4    Orrit, M.5
  • 13
    • 0041861003 scopus 로고    scopus 로고
    • Development of a photothermal deflection microscope for multi-scale studies of defects
    • G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau and C. J. Stolz, eds., Proc. SPIE
    • A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, P. Bouchut, "Development of a photothermal deflection microscope for multi-scale studies of defects," in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau and C. J. Stolz, eds., Proc. SPIE 4932, 374-384 (2003).
    • (2003) Laser-induced Damage in Optical Materials: 2001 , vol.4932 , pp. 374-384
    • During, A.1    Commandré, M.2    Fossati, C.3    Natoli, J.Y.4    Rullier, J.L.5    Bercegol, H.6    Bouchut, P.7
  • 14
    • 58149305987 scopus 로고    scopus 로고
    • Characterization of optical coatings: Damage threshold/local absorption correlation
    • H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam and M.J. Soileau, eds., Proc. SPIE
    • A. Fornier, C. Cordillot, D. Bemardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand and M. Commandré, "Characterization of optical coatings: damage threshold/local absorption correlation," in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam and M.J. Soileau, eds., Proc. SPIE 2966, 292-305 (1997).
    • (1997) Laser-induced Damage in Optical Materials: 1996 , vol.2966 , pp. 292-305
    • Fornier, A.1    Cordillot, C.2    Bemardino, D.3    Lam, O.4    Roussel, A.5    Amra, C.6    Escoubas, L.7    Albrand, G.8    Commandré, M.9
  • 15
    • 0034857223 scopus 로고    scopus 로고
    • Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy
    • G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis and M.J. Soileau, eds., Proc. SPIE
    • A.B. Papandrew, C.J. Stolz, Z.L. Wu, G.E. Loomis, S. Falabella, "Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy," in Laser-induced damage in optical materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis and M.J. Soileau, eds., Proc. SPIE 4347, 53-61 (2001).
    • (2001) Laser-induced Damage in Optical Materials: 2000 , vol.4347 , pp. 53-61
    • Papandrew, A.B.1    Stolz, C.J.2    Wu, Z.L.3    Loomis, G.E.4    Falabella, S.5
  • 16
    • 0032069389 scopus 로고    scopus 로고
    • Defect induced laser damage in oxide multilayer coatings for 248 nm
    • M. Reichling, A. Bodemann and N. Kaiser, "Defect induced laser damage in oxide multilayer coatings for 248 nm," Thin Solid Films 320, 264-279 (1998).
    • (1998) Thin Solid Films , vol.320 , pp. 264-279
    • Reichling, M.1    Bodemann, A.2    Kaiser, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.