|
Volumn 230, Issue 4-6, 2004, Pages 279-286
|
Photothermal deflection microscopy for imaging sub-micronic defects in optical materials
|
Author keywords
Absorption; Microscopy; Photothermal effects; Resolution
|
Indexed keywords
DEFECTS;
ELECTRON MICROSCOPY;
IMAGING TECHNIQUES;
ION IMPLANTATION;
LASER BEAMS;
LASER DAMAGE;
LIGHT ABSORPTION;
LIGHT TRANSMISSION;
MICROSCOPES;
OPTICAL COATINGS;
OPTICAL RESOLVING POWER;
SILICA;
TITANIUM;
PHOTOTHERMAL DEFLECTION MICROSCOPY;
SPATIAL RESOLUTION;
OPTICAL MATERIALS;
|
EID: 0348046420
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optcom.2003.11.040 Document Type: Article |
Times cited : (32)
|
References (27)
|