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Volumn 230, Issue 4-6, 2004, Pages 279-286

Photothermal deflection microscopy for imaging sub-micronic defects in optical materials

Author keywords

Absorption; Microscopy; Photothermal effects; Resolution

Indexed keywords

DEFECTS; ELECTRON MICROSCOPY; IMAGING TECHNIQUES; ION IMPLANTATION; LASER BEAMS; LASER DAMAGE; LIGHT ABSORPTION; LIGHT TRANSMISSION; MICROSCOPES; OPTICAL COATINGS; OPTICAL RESOLVING POWER; SILICA; TITANIUM;

EID: 0348046420     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2003.11.040     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.