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Volumn 3, Issue , 2013, Pages

Evaluation of intrinsic charge carrier transport at insulator-semiconductor interfaces probed by a non-contact microwave-based technique

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EID: 84887831799     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep03182     Document Type: Article
Times cited : (39)

References (37)
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