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ECS Journal of Solid State Science and Technology

Volumn 2, Issue 11, 2013, Pages

Low-roughness and easily-etched transparent conducting oxides with a stack structure of ITO and IZO

(7) Xu, Hua a Lan, Linfeng a Xu, Miao a Li, Min a Luo, Dongxiang a Xiao, Peng a Peng, Junbiao a

a SOUTH CHINA UNIVERSITY OF TECHNOLOGY (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84887500778 PISSN: 21628769 EISSN: 21628777 Source Type: Journal
DOI: 10.1149/2.024311jss Document Type: Article

Times cited : (4)

References (22)

1
- 0032672664
- M. Katayama, Thin Solid Films, 341, 140 (1999)
- (1999) Thin Solid Films , vol.341 , pp. 140
- Katayama, M.¹

2
- 21544459113
- C. W. Tang and S. A. Van Slyke, Appl. Phys. Lett., 51, 913 (1987)
- (1987) Appl. Phys. Lett , vol.51 , pp. 913
- Tang, C.W.¹ Van Slyke, S.A.²

3
- 0037157419
- C. G. Granqvist and A. Hultaker, Thin Solid Films, 411, 1 (2002)
- (2002) Thin Solid Films , vol.411 , pp. 1
- Granqvist, C.G.¹ Hultaker, A.²

4
- 84879820796
- L. Lan, N. Xiong, P. Xiao, M. Li, H. Xu, R. Yao, S. Wen, and J. Peng, Appl. Phys. Lett., 102, 242102 (2013)
- (2013) Appl. Phys. Lett , vol.102 , pp. 242102
- Lan, L.¹ Xiong, N.² Xiao, P.³ Li, M.⁴ Xu, H.⁵ Yao, R.⁶ Wen, S.⁷ Peng, J.⁸

5
- 84859294750
- D. Luo, L. Lan, M. Xu, H. Xu, M. Li, L. Wang, and J. Peng, J. Electrochem. Soc., 159, H502 (2012)
- (2012) J. Electrochem. Soc , vol.159
- Luo, D.¹ Lan, L.² Xu, M.³ Xu, H.⁴ Li, M.⁵ Wang, L.⁶ Peng, J.⁷

6
- 0029345351
- M. Takabatake, Y. Wakui, and N. Konishi, J. Electrochem. Soc., 142, 2470 (1995)
- (1995) J. Electrochem. Soc , vol.142 , pp. 2470
- Takabatake, M.¹ Wakui, Y.² Konishi, N.³

7
- 84880516171
- M. Zhao, L. Lan, H. Xu, M. Xu, M. Li, D. Luo, LeiWang, S.Wen, and J. Peng, ECS Solid State Letters, 1, P82 (2012)
- (2012) ECS Solid State Letters , vol.1
- Zhao, M.¹ Lan, L.² Xu, H.³ Xu, M.⁴ Li, M.⁵ Luo, D.⁶ Wang, L.⁷ Wen, S.⁸ Peng, J.⁹

8
- 84911130826
- M. Mohri, H. Kakinuma, and M. Sakamoto, Jpn. J. Appl. Phys., 29, 1932 (1990)
- (1990) Jpn. J. Appl. Phys , vol.29 , pp. 1932
- Mohri, M.¹ Kakinuma, H.² Sakamoto, M.³

9
- 12244268002
- A. Grigonis, R. Knizikevicius, Z. Rutkuniene, and D. Tribandis, Vacuum, 70, 319 (2003)
- (2003) Vacuum , vol.70 , pp. 319
- Grigonis, A.¹ Knizikevicius, R.² Rutkuniene, Z.³ Tribandis, D.⁴

10
- 0942299059
- C. J. Huang, Y. K. Su, and S. L. Wu, Mater. Chem. Phys., 84, 146 (2004)
- (2004) Mater. Chem. Phys , vol.84 , pp. 146
- Huang, C.J.¹ Su, Y.K.² Wu, S.L.³

11
- 0032311799
- H. Takatsuji, T. Hiromori, K. Tsujimoto, S. Tsuji, K. Kuroda, and H. Saka, Materials Research Society Symposium-Proceedings, 508, 315 (1998)
- (1998) Materials Research Society Symposium-Proceedings , vol.508 , pp. 315
- Takatsuji, H.¹ Hiromori, T.² Tsujimoto, K.³ Tsuji, S.⁴ Kuroda, K.⁵ Saka, H.⁶

12
- 44149123561
- C. Guilĺen and J. Herrero, Sol. Energy Mater. Sol. Cells, 92, 938 (2008)
- (2008) Sol. Energy Mater. Sol. Cells , vol.92 , pp. 938
- Guilĺen, C.¹ Herrero, J.²

13
- 0032628037
- K. H. Choi, J. Y. Kima, Y. S. Leeb, and H. J. Kim, Thin Solid Films, 341, 152 (1999)
- (1999) Thin Solid Films , vol.341 , pp. 152
- Choi, K.H.¹ Kima, J.Y.² Leeb, Y.S.³ Kim, H.J.⁴

14
- 80055093330
- M. Li, L. Lan, M. Xu, L. Wang, H. Xu, D. Luo, J. Zou, H. Tao, R. Yao, and J. Peng, J. Phys. D: Appl. Phys., 44, 455102 (2011)
- (2011) J. Phys D: Appl. Phys , vol.44 , pp. 455102
- Li, M.¹ Lan, L.² Xu, M.³ Wang, L.⁴ Xu, H.⁵ Luo, D.⁶ Zou, J.⁷ Tao, H.⁸ Yao, R.⁹ Peng, J.¹⁰

15
- 84867121529
- D. Luo, L. Lan, M. Xu, H. Xu, M. Li, J. Zou, H. Tao, L. Wang, and J. Peng, Phys. Status Solidi (RRL), 6, 403 (2012)
- (2012) Phys. Status Solidi (RRL) , vol.6 , pp. 403
- Luo, D.¹ Lan, L.² Xu, M.³ Xu, H.⁴ Li, M.⁵ Zou, J.⁶ Tao, H.⁷ Wang, L.⁸ Peng, J.⁹

16
- 33645519370
- T.-H. Tsai and Y.-F. Wu, J. Electrochem. Soc., 153, C86 (2006)
- (2006) J. Electrochem. Soc , vol.153
- Tsai, T.-H.¹ Wu, Y.-F.²

17
- 0001600108
- D. J. Milliron, I. G. Hill, C. Shen, A. Kahn, and J. Schwartz, J. Appl. Phys., 87, 572 (2000)
- (2000) J. Appl. Phys , vol.87 , pp. 572
- Milliron, D.J.¹ Hill, I.G.² Shen, C.³ Kahn, A.⁴ Schwartz, J.⁵

18
- 0001325427
- X. M. Ding, L. M. Hung, L. F. Cheng, Z. B.Deng, X. Y. Hou, C. S. Lee, and S. T. Lee, Appl. Phys. Lett., 76, 2704 (2000)
- (2000) Appl. Phys. Lett , vol.76 , pp. 2704
- Ding, X.M.¹ Hung, L.M.² Cheng, L.F.³ Deng, Z.B.⁴ Hou, X.Y.⁵ Lee, C.S.⁶ Lee, S.T.⁷

19
- 0000162419
- H. Kim, C. M. Gilmore, A. Piqúe, J. S. Horwitz, H. Mattoussi, H. Murata, Z. H. Kafafi, and D. B. Chrisey, J. Appl. Phys., 86, 6451 (1999)
- (1999) J. Appl. Phys , vol.86 , pp. 6451
- Kim, H.¹ Gilmore, C.M.² Piqúe, A.³ Horwitz, J.S.⁴ Mattoussi, H.⁵ Murata, H.⁶ Kafafi, Z.H.⁷ Chrisey, D.B.⁸

20
- 34548826610
- A. K. Kulkarni, T. Lim,M. Khan, and K. H. Schulz, J. Vac. Sci. Technol., A, 16, 1636 (1998)
- (1998) J. Vac. Sci. Technol., A , vol.16 , pp. 1636
- Kulkarni, A.K.¹ Limm. Khan, T.² Schulz, K.H.³

21
- 0034509122
- J. S. Kim, J. W. Bae, H. J. Kim, N.-E. Lee, G. Y. Yeom, and K. H. Oh, Thin Solid Films, 377-378, 103 (2000)
- (2000) Thin Solid Films , vol.377-378 , pp. 103
- Kim, J.S.¹ Bae, J.W.² Kim, H.J.³ Lee, N.-E.⁴ Yeom, G.Y.⁵ Oh, K.H.⁶

22
- 0016992850
- G. Haacke, J. Appl. Phys., 47, 4086 (1976)
- (1976) J. Appl. Phys , vol.47 , pp. 4086
- Haacke, G.¹

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