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Volumn , Issue , 2010, Pages

High performance InAlN/GaN HEMTs on sic substrate

Author keywords

Compound semiconductor; High electron mobility transistors(HEMT); InAlN GaN

Indexed keywords

COMPOUND SEMICONDUCTORS; FABRICATED DEVICE; HIGH ELECTRON MOBILITY TRANSISTOR (HEMT); HIGH ELECTRON MOBILITY TRANSISTOR (HEMTS); INALN/GAN; INALN/GAN HEMTS; MAXIMUM DRAIN CURRENT; SURFACE PASSIVATION;

EID: 84887331048     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 1
    • 46049101641 scopus 로고    scopus 로고
    • Can inaln/gan be an alternative to high power high temperature AlGaN/GaN devices?
    • Tech. Digest
    • F. Medjdoub et al., "Can InAlN/GaN be an alternative to high power high temperature AlGaN/GaN devices?" 2006 Int. Electron Devices Meeting (IEDM), 2006, Tech. Digest, 927.
    • (2006) 2006 Int. Electron Devices Meeting (IEDM) , pp. 927
    • Medjdoub, F.1
  • 3
    • 41749104473 scopus 로고    scopus 로고
    • Gate current degradation mechanisms of GaN high electron mobility transistors
    • J. Joh, L. Xia, and J. A. del Alamo, "Gate Current Degradation Mechanisms of GaN High Electron Mobility Transistors" IEEE International Electron Devices Meeting, 2007., pp.385-388.
    • (2007) IEEE International Electron Devices Meeting , pp. 385-388
    • Joh, J.1    Xia, L.2    Alamo, J.A.D.3
  • 4
    • 46049094023 scopus 로고    scopus 로고
    • Mechanisms for electrical degradation of GaN high-electron mobility transistors
    • J. Joh and J. A. del Alamo, "Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors" IEEE International Electron Devices Meeting, 2006., pp.1-4.
    • (2006) IEEE International Electron Devices Meeting , pp. 1-4
    • Joh, J.1    Alamo, J.A.D.2
  • 7
    • 4243188128 scopus 로고    scopus 로고
    • InAlN/GaN heterostructure field-effect transistors grown by plasma-assisted molecular-beam epitaxy
    • M. Higashiwaki and T. Matsui, "InAlN/GaN Heterostructure Field-Effect Transistors Grown by Plasma-Assisted Molecular-Beam Epitaxy" Jpn. J. Appl. Phys. 43 (2004) pp. L768-L770.
    • (2004) Jpn. J. Appl. Phys. , vol.43
    • Higashiwaki, M.1    Matsui, T.2
  • 8
    • 33846234502 scopus 로고    scopus 로고
    • High- performance short-gate InAlN/GaN heterostructure field- effect transistors
    • M. Higashiwaki, T. Mimura, and T. Matsui, "High- Performance Short-Gate InAlN/GaN Heterostructure Field- Effect Transistors" Jpn. J. Appl. Phys. 45 (2006).
    • (2006) Jpn. J. Appl. Phys. , vol.45
    • Higashiwaki, M.1    Mimura, T.2    Matsui, T.3
  • 12
    • 20544448948 scopus 로고    scopus 로고
    • Gate-recessed AlGaN-GaN HEMTs for high-performance millimeter-wave applications
    • Jun
    • J. S. Moon et al., "Gate-recessed AlGaN-GaN HEMTs for high-performance millimeter-wave applications" IEEE Electron Device Lett., vol. 26, no. 6, pp. 348-350, Jun. 2005.
    • (2005) IEEE Electron Device Lett. , vol.26 , Issue.6 , pp. 348-350
    • Moon, J.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.