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Volumn 184, Issue 2, 2013, Pages 321-328

Xmipp 3.0: An improved software suite for image processing in electron microscopy

Author keywords

Electron microscopy; Image processing; Single particles analysis; Software package

Indexed keywords

ANALYTICAL PARAMETERS; ARTICLE; COMPUTER GRAPHICS; COMPUTER PROGRAM; COMPUTER SYSTEM; CONCEPT FORMATION; ELECTRON MICROSCOPY; IMAGE DISPLAY; IMAGE PROCESSING; MAXIMUM LIKELIHOOD METHOD; PRIORITY JOURNAL; PRODUCT DEVELOPMENT; REPRODUCIBILITY; STANDARD; WORKFLOW;

EID: 84887257621     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2013.09.015     Document Type: Article
Times cited : (257)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.