FASTDEF: Fast defocus and astigmatism estimation for high-throughput transmission electron microscopy

Journal of Structural Biology

Volumn 181, Issue 2, 2013, Pages 136-148

  Vargas, J ^a   Oton J ^a   Marabini, R ^b   Jonic, S ^c   de la Rosa Trevin J M ^a   Carazo, J M ^a   Sorzano, C O S ^a  

^a CENTRO NACIONAL DE BIOTECNOLOGÍA   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

Contrast transfer function; Power spectrum; Single particle analysis

Indexed keywords

ACCURACY; ALGORITHM; ARTICLE; ASTIGMATISM; AUTOMATION; CRYOELECTRON MICROSCOPY; HIGH THROUGHPUT SCREENING; POWER SPECTRUM; PRIORITY JOURNAL; PROCESS OPTIMIZATION; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

ALGORITHMS; CALIBRATION; HIGH-THROUGHPUT SCREENING ASSAYS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, THEORETICAL; SOFTWARE;

EID: 84873143158     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2012.12.006     Document Type: Article

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