Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics

Journal of Structural Biology

Volumn 184, Issue 2, 2013, Pages 237-244

  Marko, Michael ^a,b   Meng, Xing ^a   Hsieh, Chyongere ^a   Roussie, James ^c   Striemer, Christopher ^c  

^a WADSWORTH CENTER   (United States)

^b STATE UNIVERSITY OF NEW YORK   (United States)

^c SiMPore Inc   (United States)

Author keywords

Cryo EM; Cryo tomography; CTF; Image contrast; Phase plate; Zernike

Indexed keywords

ALUMINUM; CARBON; CHROMIUM; IRIDIUM; RHODIUM; SILICON;

AGING; ANALYTICAL EQUIPMENT; ARTICLE; COST; CRYOELECTRON MICROSCOPY; ELECTRON BEAM; FILM; IRRADIATION; MATERIAL COATING; PHASE CONTRAST MICROSCOPY; POWER SPECTRUM; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; ZERNIKE PHASE PLATE;

CRYO-EM; CRYO-TOMOGRAPHY; CTF; IMAGE CONTRAST; PHASE PLATE; ZERNIKE;

CRYOELECTRON MICROSCOPY; ELECTRON MICROSCOPE TOMOGRAPHY; MATERIALS TESTING; SILICON;

EID: 84887224700     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2013.08.008     Document Type: Article

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