Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopy

Ultramicroscopy

Volumn 111, Issue 12, 2011, Pages 1688-1695

  Buijsse, Bart ^a   van Laarhoven, Frank M H M ^a   Schmid, Andreas K ^b   Cambie, Rossana ^b   Cabrini, Stefano ^b   Jin, Jian ^b   Glaeser, Robert M ^b  

^a Thermo Fisher Scientific   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Charging; Phase contrast; Single sideband aperture

Indexed keywords

APPROPRIATE MATERIALS; DATA COLLECTION; DEFOCUS; DOUBLE-SIDEBAND; FULLY COMPATIBLE; HALF-PLANES; HIGH-CONTRAST IMAGES; HYBRID DESIGN; NOVEL DESIGN; OBJECTIVE LENS; PHASE CONTRASTS; SCATTERED ELECTRONS; SCATTERING ANGLES; SINGLE-SIDEBAND APERTURE;

CHARGING (FURNACE); DIFFRACTION PATTERNS; ELECTRON MICROSCOPY; INTERFEROMETRY;

DESIGN;

ARTICLE; CONTRAST ENHANCEMENT; DIFFRACTION; DOUBLE SIDEBAND OBJECTIVE APERTURE; ELECTRON MICROSCOPY; EQUIPMENT DESIGN; FOIL; FOURIER TRANSFORMATION; IMAGE ANALYSIS; INFORMATION PROCESSING; LABORATORY DEVICE; MICROTECHNOLOGY; SINGLE SIDEBAND OBJECTIVE APERTURE; STATIC ELECTRICITY; INSTRUMENTATION; METHODOLOGY; PHASE CONTRAST MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

TULIPA;

MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, TRANSMISSION; MICROSCOPY, PHASE-CONTRAST;

EID: 81055138977     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.09.015     Document Type: Article

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