Improving fabrication and application of zach phase plates for phase-contrast transmission electron microscopy

Microscopy and Microanalysis

Volumn 18, Issue 5, 2012, Pages 1010-1015

  Hettler, Simon ^a   Gamm, Björn ^a   Dries, Manuel ^a   Frindt, Nicole ^b   Schröder, Rasmus R ^b   Gerthsen, Dagmar ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

charging; contamination; heating device; phase contrast; phase plate; transmission electron microscopy; weak phase object

Indexed keywords

EID: 84868570622     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612001560     Document Type: Article

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