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Volumn 174, Issue 3, 2011, Pages 468-475

Accurate modeling of single-particle cryo-EM images quantitates the benefits expected from using Zernike phase contrast

Author keywords

Cryo electron microscopy; Heterogeneity; Image simulation; Multislice; Zernike phase contrast

Indexed keywords

ARTICLE; CONTRAST ENHANCEMENT; CRYOELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE QUALITY; PRIORITY JOURNAL; SIMULATION;

EID: 79955669566     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2011.03.020     Document Type: Article
Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.