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Volumn 61, Issue 20, 2013, Pages 7805-7815

Correlation between structure and semiconductor-to-metal transition characteristics of VO2/TiO2/sapphire thin film heterostructures

Author keywords

Epitaxy; Semiconductor to metal transition; Strain; TiO2; VO2

Indexed keywords

CONTROLLED ORIENTATION; HIGH RESOLUTION X RAY DIFFRACTION; MICRO-STRUCTURAL CHARACTERISTICS; OUT-OF-PLANE ORIENTATION; SEMICONDUCTOR-TO-METAL TRANSITIONS; STRUCTURAL INVESTIGATION; TIO; VO2;

EID: 84886265976     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2013.09.019     Document Type: Article
Times cited : (50)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.