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Applied Physics Letters

Volumn 100, Issue 25, 2012, Pages

Domain epitaxy in TiO 2/α-Al 2O 3 thin film heterostructures with Ti 2O 3 transient layer

(6) Bayati, M R a Molaei, R a Narayan, R J a,b Narayan, J a Zhou, H a,c Pennycook, S J c

a North Carolina State University (United States)

b NORTH CAROLINA STATE UNIVERSITY (United States)

c OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM/SUBSTRATE INTERFACE; HEXAGONAL STRUCTURES; RUTILE FILMS; RUTILE TIO; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SYMMETRY MISMATCH; TETRAGONAL STRUCTURE; TIO; TRANSIENT LAYER;

ALUMINA; EPITAXIAL GROWTH; HETEROJUNCTIONS; MONOLAYERS; OXIDE MINERALS; SAPPHIRE; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

INTERFACES (MATERIALS);

EID: 84863331009 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4729937 Document Type: Article

Times cited : (30)

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