|
Volumn 583, Issue , 2014, Pages 476-480
|
Frequency dependent electrical characteristics of BiFeO3 MOS capacitors
|
Author keywords
BiFeO3; Conductance; Interface states; MOS capacitor; Series resistance; XRD
|
Indexed keywords
BIFEO3;
CONDUCTANCE MEASUREMENT;
ELECTRICAL CHARACTERISTIC;
LOW AND HIGH FREQUENCIES;
LOW FREQUENCY REGIONS;
RF-MAGNETRON SPUTTERING;
SERIES RESISTANCES;
XRD;
DIELECTRIC DEVICES;
ELECTRIC CONDUCTANCE;
ELECTRIC RESISTANCE;
INTERFACE STATES;
MAGNETRON SPUTTERING;
MOS CAPACITORS;
|
EID: 84884617374
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2013.08.204 Document Type: Article |
Times cited : (50)
|
References (30)
|