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Volumn 82, Issue 11, 2008, Pages 1203-1207
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Characterization of interface states at Au/SnO2/n-Si (MOS) structures
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Author keywords
C V and G V characteristics; Interface states; MOS structures; Series resistance
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Indexed keywords
CAPACITANCE;
ELECTRIC CONDUCTANCE;
INTERFACES (MATERIALS);
MEASUREMENT THEORY;
INTERFACE STATES;
MOS STRUCTURES;
GOLD COMPOUNDS;
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EID: 46549085106
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2007.12.014 Document Type: Article |
Times cited : (46)
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References (34)
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