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Volumn 82, Issue 11, 2008, Pages 1203-1207

Characterization of interface states at Au/SnO2/n-Si (MOS) structures

Author keywords

C V and G V characteristics; Interface states; MOS structures; Series resistance

Indexed keywords

CAPACITANCE; ELECTRIC CONDUCTANCE; INTERFACES (MATERIALS); MEASUREMENT THEORY;

EID: 46549085106     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2007.12.014     Document Type: Article
Times cited : (46)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.