메뉴 건너뛰기




Volumn 13, Issue 9, 2013, Pages 4369-4373

Strengthening brittle semiconductor nanowires through stacking faults: Insights from in situ mechanical testing

Author keywords

GaAs nanowires; in situ deformation; molecular dynamics; stacking fault; strengthening; transmission electron microscopy

Indexed keywords

DEFECT ENGINEERING; GAAS NANOWIRES; MOLECULAR DYNAMICS SIMULATIONS; SEMICONDUCTOR NANOWIRE; SITU DEFORMATION; WURTZITE NANOWIRES; WURTZITES; ZINC-BLENDE;

EID: 84884225596     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl402180k     Document Type: Article
Times cited : (48)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.