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Volumn 28, Issue 7, 2013, Pages 1080-1089
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A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL ANALYSIS;
DIFFUSION;
IONS;
OPTIMIZATION;
OXYGEN;
SECONDARY EMISSION;
SECONDARY ION MASS SPECTROMETRY;
STRONTIUM;
CHEMICAL MAPPING;
DEAD TIME EFFECTS;
LATERAL RESOLUTION;
OXYGEN DIFFUSION COEFFICIENTS;
OXYGEN ISOTOPE EXCHANGE;
SIGNAL SATURATION;
TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;
TOF-SIMS ANALYSIS;
ISOTOPES;
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EID: 84883232931
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/c3ja50059d Document Type: Article |
Times cited : (56)
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References (74)
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