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Volumn 28, Issue 7, 2013, Pages 1080-1089

A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; DIFFUSION; IONS; OPTIMIZATION; OXYGEN; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; STRONTIUM;

EID: 84883232931     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c3ja50059d     Document Type: Article
Times cited : (56)

References (74)
  • 70


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.