Chemical heterogeneities on La 0.6Sr 0.4CoO 3-δ thin films-correlations to cathode surface activity and stability

Chemistry of Materials

Volumn 24, Issue 6, 2012, Pages 1116-1127

  Cai, Zhuhua ^a   Kubicek, Markus ^b   Fleig, Jürgen ^b   Yildiz, Bilge ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY; CATHODE SURFACE; CATION CONTENT; CHEMICAL BONDINGS; CHEMICAL HETEROGENEITIES; CO OXIDATION; DEPTH DISTRIBUTION; DRIVING FORCES; ELECTROCHEMICAL ACTIVITIES; ELECTROCHEMICAL PERFORMANCE; ELECTRON TRANSFER; MATERIAL MICROSTRUCTURES; NANOSCALE RESOLUTIONS; OXYGEN REDUCTION; PARTIAL BLOCKAGE; SOLID OXIDE; SPATIAL HETEROGENEITY; STRUCTURAL CHANGE; SURFACE CATIONS; THIN FILM CATHODES; VACANCY CONTENT;

AUGER ELECTRON SPECTROSCOPY; CATHODES; CHEMICAL BONDS; COBALT COMPOUNDS; ELECTROLYTIC REDUCTION; ELECTRONIC STRUCTURE; LANTHANUM; PHASE SEPARATION; POSITIVE IONS; PULSED LASER DEPOSITION; SURFACE CHEMISTRY; SURFACES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE SEGREGATION;

EID: 84859125198     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm203501u     Document Type: Article

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