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Volumn 14, Issue 40, 2012, Pages 13971-13978
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Determination of proton- and oxide ion tracer diffusion in lanthanum tungstate (La/W = 5.6) by means of ToF-SIMS
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84866990942
PISSN: 14639076
EISSN: None
Source Type: Journal
DOI: 10.1039/c2cp42278f Document Type: Article |
Times cited : (22)
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References (31)
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