Linearity of the instrumental intensity scale in TOF-SIMS - A VAMAS interlaboratory study

Surface and Interface Analysis

Volumn 44, Issue 1, 2012, Pages 1-14

  Lee, J L S ^a   Gilmore, I S ^a   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

counting statistics; dead time; dead time correction; detector saturation; intensity linearity; interlaboratory comparison; secondary ion mass spectrometry; VAMAS

Indexed keywords

COUNTING STATISTICS; DEAD TIME; DEAD-TIME CORRECTION; INTENSITY LINEARITY; INTERLABORATORY COMPARISON; SECONDARY IONS; VAMAS;

DETECTORS; ION BEAMS; ISOTOPES; LABORATORIES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY;

IONS;

EID: 83555172373     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3761     Document Type: Article

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