Coherent X-ray diffraction imaging of morphology and strain in nanomaterials

JOM

Volumn 65, Issue 9, 2013, Pages 1202-1207

  Harder, Ross ^a   Robinson, Ian K ^b,c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c Research Complex at Harwell   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG DIFFRACTION; COHERENT DIFFRACTION IMAGING; COHERENT X-RAY DIFFRACTION IMAGING; HIGH SENSITIVITY; INTERNAL STRUCTURE; NANOSCALE CHARACTERIZATION; SPACIAL COHERENCE; X-RAY CHARACTERIZATION;

FREE ELECTRON LASERS; X RAY RADIOGRAPHY;

X RAY DIFFRACTION;

EID: 84883217843     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-013-0682-4     Document Type: Article

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