Three-dimensional electron density mapping of shape-controlled nanoparticle by focused hard X-ray diffraction microscopy

Nano Letters

Volumn 10, Issue 5, 2010, Pages 1922-1926

  Takahashi, Yukio ^a   Zettsu, Nobuyuki ^a   Nishino, Yoshinori ^b   Tsutsumi, Ryosuke ^a   Matsubara, Eiichiro ^c   Ishikawa, Tetsuya ^d   Yamauchi, Kazuto ^a  

^a OSAKA UNIVERSITY   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

^d RIKEN SPring 8 Center ^*  (Japan)

Author keywords

Coherent X ray diffraction microscopy; Electron density; Phase retrieval; Shape controlled nanoparticle; X ray free electron laser

Indexed keywords

COHERENT X-RAY DIFFRACTION; ELECTRON DENSITIES; PHASE RETRIEVAL; SHAPE-CONTROLLED; SHAPE-CONTROLLED NANOPARTICLE; X-RAY FREE ELECTRON LASERS;

CARRIER CONCENTRATION; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON DENSITY MEASUREMENT; ELECTRONIC DENSITY OF STATES; ELECTRONS; FREE ELECTRON LASERS; HOLOGRAPHIC INTERFEROMETRY; IMAGING SYSTEMS; LASERS; NANOPARTICLES; NUCLEAR INSTRUMENTATION; THREE DIMENSIONAL; X RAY DIFFRACTION; X RAYS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

NANOMATERIAL;

ARTICLE; CHEMISTRY; CONFORMATION; ELECTRON MICROSCOPY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE; X RAY DIFFRACTION;

IMAGING, THREE-DIMENSIONAL; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ELECTRON; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 77952350347     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl100891n     Document Type: Article

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