Atomic structures of silicene layers grown on Ag(111): Scanning tunneling microscopy and noncontact atomic force microscopy observations

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Resta, Andrea ^a   Leoni, Thomas ^a   Barth, Clemens ^a   Ranguis, Alain ^a   Becker, Conrad ^a   Bruhn, Thomas ^b   Vogt, Patrick ^b   Le Lay, Guy ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

METAL NANOPARTICLE; SILICON; SILVER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; METHODOLOGY; PARTICLE SIZE; SCANNING TUNNELING MICROSCOPY; ULTRASTRUCTURE; PROCEDURES;

METAL NANOPARTICLES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING TUNNELING; MOLECULAR CONFORMATION; PARTICLE SIZE; SILICON; SILVER;

EID: 84882667551     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02399     Document Type: Article

References (40)

1. Vogt, P. et al. Compelling Experimental Evidence for Graphenelike Two- Dimensional Silicon. Phys. Rev. Lett. 108, 155501 (2012).
2. Xu, M., Liang, T., Shi, M. & Cheng, H. Graphene-like two dimensional materials, Chemical Reviews 113, 3766 (2013).
3. Lin, C.-L. et al. Structure of Silicene Grown onAg(111). Appl. Phys. Exp. 5, 045802 (2012).
4. Chiappe, D., Grazianetti, C., Tallarida, G., Fanciulli, M. & Molle, A. Local Electronic Properties of Corrugated Silicene Phases. Adv. Mater. 24, 5088 (2012).
5. Fleurence, A. et al. Y. Experimental Evidence for Epitaxial Silicene on Diboride Thin Films. Phys. Rev. Lett. 108, 245501 (2012).
6. Meng, L. et al. Buckled Silicene Formation on Ir(111). Nano Lett. 13, 685 (2013).
7. Arafune, R. et al. Structural transition of silicene on Ag(111). Surface Science 608, 297 (2013).
8. Chen, L., Feng, B. & Wu, K. Observation of a possible superconducting gap in silicene on Ag(111) Surface. App. Phys. Lett. 102, 081602 (2013).
9. Barth, C., Foster, A. S., Henry, C. R. & Shluger, A. L. Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods. Adv. Mater. 23, 477 (2011).
10. Hofer, W. A., Foster, A. S. & Shluger, L. A. Theories of scanning probe microscopes at the atomic scale. Rev. Mod. Phys. 75, 1287 (2003).
11. Sweetman, A. et al. Simultaneous noncontact AFM and STM of Ag:Si(111)-(!33 !3)R30u. Phys. Rev. B 87, 075310 (2013).
12. Gross, L., Mohn, F., Moll, N., Liljeroth, P. & Meyer, G. The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy. Science 325, 1110 (2009).
13. Repp, J., Meyer, G., Paavilainen, S., Olsson, F. E. & Persson, M. Imaging Bond Formation Between a Gold Atom and Pentacene on an Insulating Surface. Science 312, 1196 (2006).
14. Guillermet, O. et al. STM and AFM high resolution intramolecular imaging of a single decastarphene molecule. Chem. Phys. Lett. 511, 482 (2011).
15. Le Lay, G., De Padova, P., Resta, A., Bruhn, T. & Vogt, P. Epitaxial silicene: can it be strongly strained? J. Phys. D: Appl. Phys. 45, 392001 (2012).
16. Gao, J. & Zhao, J. Initial geometries, interaction mechanism and high stability of silicene on Ag(111). Sci. Rep. 2, 1 (2012).
17. De Padova, P. et al. Evidence of Dirac fermions in multilayer silicene. Appl. Phys.Lett. 102, 163106 (2013).
18. Takeda, K. & Shiraishi, K. Theoretical possibility of stage corrugation in Si and Ge analogs of graphite. Phys. Rev. B 50, 14916 (1994).
19. Kamal, C., Chakrabarti, A., Banerjee, A. & Deb, S. K. Silicene beyondmono-layers different stacking configurations and their properties. J. Phys.:Condens. Matter 25, 085508 (2013).
20. Motohiko, E. Quasi-Topological Insulator and Trigonal Warping inGated Bilayer Silicene. J. Phys. Soc. Japan 81,104713 (2012).
21. Feng, B. et al. Evidence of Silicene inHoneycomb Structures of Silicon on Ag(111). Nano Lett. 12, 3507 (2012).
22. Chen, L. et al. Evidence for Dirac Fermions in a Honeycomb Lattice Based on Silicon. Phys. Rev. Lett. 109, 056804 (2012).
23. Chen, L. et al. Spontaneous Symmetry Breaking and Dynamic Phase Transition in Monolayer Silicene. Phys. Rev Lett. 110, 085504 (2013).
24. Cinquanta, E. et al. Getting through the nature of silicene: sp2-sp3 twodimensional silicon nanosheet. arXiv:1212.5422v3.
25. Eguchi, T. & Hasegawa Y. High Resolution Atomic Force Microscopic Imaging of the Si(111)73 7 Surface: Contribution of Short-Range Force to the Images. Phys. Rev. Lett. 89, 266105 (2002).
26. Pérez, R., Štich, I., Payne, M. C. & Terakura, K. Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111). Phys. Rev. B 58, 10835 (1998).
27. Sweetman, A., Jarvis, S., Danza, R. & Moriarty, P. Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5K: Probing the probe. Beilstein J. Nanotechnol. 3, 25 (2012).
28. Lin, C.-L. et al. Substrate-Induced Symmetry Breaking in Silicene. Phys. Rev. Lett. 110, 076801 (2013).
29. Calleja, F. et al. Contrast Reversal and Shape Changes of Atomic Adsorbates Measured with Scanning Tunneling Microscopy. Phys. Rev. Lett. 92, 206101 (2004).
30. Berger, J. et al. Characterization of the mechanical properties of qPlus sensors. Beilstein J. of Nanotechnol, 4, 1 (2013).
31. Sugimoto, Y., Namikawa, T., Miki, K., Abe, M. & Morita, S. Vertical and lateral force mapping on the Si(111)-(737) surface by dynamic force microscopy. Phys. Rev B 77, 195424 (2008).
32. Arai, T. & Tomitori, M. Observation of Electronic States on Si(111)-(7 3 7) through Short-Range Attractive Force with Noncontact Atomic Force Spectroscopy. Phys. Rev. Lett. 93, 256101 (2004).
33. Melitz, W., Shen, J., Kummel, A. C. & Lee, S. Kelvin probe force microscopy and its application. Surf. Sci. Rep. 66, 1 (2011).
34. Cabailh, G., Henry, C. R. & Barth, C. Thin NaCl films on silver (001): island growth and work function. New J. of Phys. 14, 103037 (2012).
35. Sadewasser. et al. New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors, Phys. Rev. Lett. 103, 266103 (2009).
36. Oyabu, N., Custance, O., Yi, I., Sugawara, Y. & Morita, S. Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy. Phys. Rev. Lett. 90, 176102 (2003).
37. Sweetman A. et al. Toggling Bistable Atoms via Mechanical Switching of Bond Angle. Phys. Rev. Lett. 106, 136101 (2011).
38. Leoni, T. et al. Controlling the Charge State of a Single Redox Molecular Switch. Phys. Rev. Lett. 106, 216103 (2011).
39. Hynninen, T., Cabailh, G., Foster, A. S. & Barth, C. Defect mediated manipulation of nanoclusters on an insulator. Sci. Rep. 3, 1270 (2013).
40. Bombis, Ch. et al. Mechanical Behavior of Nanocrystalline NaCl Islands on Cu(111). Phys. Rev. Lett. 104, 185502 (2010).