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Advanced Materials

Volumn 24, Issue 37, 2012, Pages 5088-5093

Local electronic properties of corrugated silicene phases

(5) Chiappe, Daniele a Grazianetti, Carlo a,b Tallarida, Grazia a Fanciulli, Marco a,b Molle, Alessandro a

a LABORATORIO MDM (Italy)

b UNIVERSITY OF MILANO BICOCCA (Italy)

Author keywords

graphene like; scanning tunneling microscopy; silicene; silicon; spectroscopy

Indexed keywords

DENSITY OF STATE; EPITAXIALLY GROWN; GRAPHENE-LIKE; GROWTH PARAMETERS; SCANNING TUNNELING SPECTROSCOPY; SILICENE; SILICON STRUCTURES; SYMMETRY-BREAKING;

GRAPHENE; SCANNING TUNNELING MICROSCOPY; SILICON; SPECTROSCOPY;

ELECTRONIC PROPERTIES;

GRAPHITE; NANOMATERIAL; SILICON; SILVER;

ARTICLE; CHEMISTRY; ELECTRON; SCANNING TUNNELING MICROSCOPY; ULTRASTRUCTURE;

ELECTRONS; GRAPHITE; MICROSCOPY, SCANNING TUNNELING; NANOSTRUCTURES; SILICON; SILVER;

EID: 84866492592 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201202100 Document Type: Article

Times cited : (294)

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