Dynamic stress analysis applied to (111)-textured Pt in HClO4 electrolyte

Journal of the Electrochemical Society

Volumn 160, Issue 9, 2013, Pages

  Lafouresse, M C ^a   Bertocci, U ^a   Stafford, G R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE LAYER REGION; DYNAMIC STRESS ANALYSIS; ELECTROCHEMICAL IMPEDANCE; EXPERIMENTAL METHODS; HYDROGEN ADSORPTION; POSITIVE POTENTIAL; REVERSIBLE ADSORPTION; STEADY-STATE POTENTIALS;

CHARGE DENSITY; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTROLYTES; NANOCANTILEVERS; SURFACE PROPERTIES;

PLATINUM;

EID: 84881518770     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.003310jes     Document Type: Article

References (59)

1. C. Friesen, N. Dimitrov, R. C. Cammarata, and K. Sieradzki, Langmuir, 17, 807 (2001).
2. N. Vasiljevic, T. Trimble, N. Dimitrov, and K. Sieradzki, Langmuir, 20, 6639 (2004).
3. T. Heaton and C. Friesen, J. Phys. Chem. C, 111, 14433 (2007).
4. M. Smetanin, R. N. Viswanath, D. Kramer, D. Beckmann, T. Koch, L. A. Kibler, D. M. Kolb, and J. Weissmüller, Langmuir, 24, 8561 (2008).
5. W. Haiss, R. J. Nichols, J. K. Sass, and K. P. Charle, J. Electroanal. Chem., 452, 199 (1998).
6. T. Trimble, L. Tang, N. Vasiljevic, N. Dimitrov, M. van Schilfgaarde, C. Friesen, C. V. Thompson, S. C. Seel, J. A. Floro, and K. Sieradzki, Phys. Rev. Let., 95, 166106 (2005).
7. R. N. Viswanath, D. Kramer, and J.Weissmüller, Electrochim. Acta, 53, 2757 (2008).
8. L. Mickelson, T. Heaton, and C. Friesen, J. Phys. Chem. C, 112, 1060 (2008).
9. H. Feigenbaum and R. Weil, J. Electrochem. Soc., 126, 2085 (1979).
10. W. Haiss and J. K. Sass, J. Electroanal. Chem., 410, 119 (1996).
11. T. A. Brunt, E. D. Chabala, T. Rayment, S. J. O'Shea, and M. E. Welland, J. Chem. Soc., Faraday Trans., 92, 3807 (1996).
12. T. A. Brunt, T. Rayment, S. J. O'Shea, and M. E. Welland, Langmuir, 12, 5942 (1996).
13. M. Seo and M. Yamazaki, J. Electrochem. Soc., 151, E276 (2004).
14. G. R. Stafford and U. Bertocci, J. Phys. Chem. B, 110, 15493 (2006).
15. M. Seo and M. Yamazaki, J. Solid State Electrochem., 11, 1365 (2007).
16. G. R. Stafford and U. Bertocci, J. Phys. Chem. C, 111, 17580 (2007).
17. G. R. Stafford and U. Bertocci, J. Phys. Chem. C, 113, 261 (2009).
18. Z. L. Bao, S. Grist, S. Majumder, L. B. Xu, E. Jensen, and K. L. Kavanagh, J. Electrochem. Soc., 156, D138 (2009).
19. J. W. Shin, U. Bertocci, and G. R. Stafford, J. Phys. Chem. C, 114, 17621 (2010).
20. J. W. Shin, U. Bertocci, and G. R. Stafford, J. Phys. Chem. C, 114, 7926 (2010).
21. W. Haiss, R. J. Nichols, and J. K. Sass, Surf. Sci., 388, 141 (1997).
22. C. Friesen, S. C. Seel, and C. V. Thompson, J. Appl. Phys., 95, 1011 (2004).
23. O. E. Kongstein, U. Bertocci, and G. R. Stafford, J. Electrochem. Soc., 152, C116 (2005).
24. S. J. Hearne and J. A. Floro, J. Appl. Phys., 97, 014901 (2005).
25. S. J. Hearne, S. C. Seel, J. A. Floro, C. W. Dyck,W. Fan, and S. R. J. Brueck, J. Appl. Phys., 97, 083530 (2005).
26. A. Bhandari, B. W. Sheldon, and S. J. Hearne, J. Appl. Phys., 101, 033528 (2007).
27. S. Ahmed, T. T. Ahmed,M.O'Grady, S. Nakahara, and D. N. Buckley, J. Appl. Phys., 103, 073506 (2008).
28. A. Bhandari, S. J. Hearne, B. W. Sheldon, and S. K. Soni, J. Electrochem. Soc., 156, D279 (2009).
29. J. W. Shin and E. Chason, Phys. Rev. Lett., 103, 056102 (2009).
30. T. Z. Luo, L. Guo, and R. C. Cammarata, J. Crystal Growth, 312, 1267 (2010).
31. E. Rouya, G. R. Stafford, C. Beauchamp, J. A. Floro, R. G. Kelly, M. L. Reed, and G. Zangari, Electrochemical and Solid-State Letters, 13, D87 (2010).
32. S. R. Brankovic, B. Kagajwala, J. George, G. Majkic, G. R. Stafford, and P. Ruchhoeft, Electrochim Acta, 83, 387 (2012).
33. M. C. Lafouresse, U. Bertocci, C. R. Beauchamp, and G. R. Stafford, J. Electrochem. Soc., 159, H816 (2012).
34. A. Y. Gokhshtein, Electrochim Acta, 15, 219 (1970).
35. M. Seo, T. Makino, and N. Sato, J. Electrochem. Soc., 133, 1138 (1986).
36. M. Seo and M. Aomi, J. Electrochem. Soc., 139, 1087 (1992).
37. R. C. Cammarata and K. Sieradzki, Annu. Rev. Mater. Sci., 24, 215 (1994).
38. R. Shuttleworth, Proc. Phys. Soc. (London) A, 63, 444 (1950).
39. D. C. Grahame, Chem. Rev., 41, 441 (1947).
40. H.-J. Jin, S. Parida, D. Kramer, and J. Weissmüller, Surf. Sci., 602, 3588 (2008).
41. R. N. Viswanath, D. Kramer, and J. Weissmüller, Langmuir, 21, 4604 (2005).
42. Y. Umeno, C. Elsässer, B. Meyer, P. Gumbsch, M. Nothacker, J. Weissmüller, and F. Evers, EPL, 78, 13001 (2007).
43. J.-M. Albina, C. Elsasser, J. Weissmüller, P. Gumbsch, and Y. Umeno, Phys. Rev. B, 85, 125118 (2012).
44. M. Seo and Y. Serizawa, J. Electrochem. Soc., 150(10), E472 (2003).
45. H. Ibach, Surf. Sci. Reports, 29, 193 (1997).
46. P. J. Feibelman, Phys. Rev. B, 56, 2175 (1997).
47. J. Weissmüller, R. N. Viswanath, L. A. Kibler, and D. M. Kolb, Phys. Chem. Chem. Phys., 13, 2114 (2011).
48. G. G. Stoney, Proc. R. Soc. London Ser. A, 82, 172 (1909).
49. J. Nocedal and S. J. Wright, Numerical Optimization, 2nd ed., (Springer, New York, 2006).
50. J. E. Sader, J. Appl. Phys., 84, 64 (1998).
51. D. M. Kolb and J. Schneider, Electrochim. Acta, 31, 929 (1986).
52. J. W. Shin, U. Bertocci, and G. R. Stafford, J. Electrochem. Soc., 158, F127 (2011).
53. G. R. Stafford and U. Bertocci, J. Phys. Chem. C, 113, 13249 (2009).
54. J.-B. Park and S.-M. Park, J. Electroanal. Chem., 656, 243 (2011).
55. T. Pajkossy and D. M. Kolb, Electrochim Acta, 46, 3063 (2001).
56. H. Ibach, J. Vac. Sci. Technol., A12, 2240 (1994).
57. W. Haiss, Rep. Prog. Phys., 64, 591 (2001).
58. G. Jerkiewicz, G. Vatankhah, J. Lessard, M. P. Soriaga, and Y.-S. Park, Electrochim. Acta, 49, 1451 (2004).
59. A. Sun, J. Franc, and D. D. Macdonald, J. Electrochem. Soc., 153, B260 (2006).