Simultaneous electrochemical and mechanical impedance spectroscopy using cantilever curvature

Journal of the Electrochemical Society

Volumn 159, Issue 10, 2012, Pages

  Lafouresse, M C ^a   Bertocci, U ^a   Beauchamp, C R ^a   Stafford, G R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATED VALUES; DOUBLE LAYER REGION; IN-SITU STRESS MEASUREMENT; LINEAR RESPONSE; MAXIMAL VALUES; MECHANICAL IMPEDANCES; SIGNAL AMPLITUDE; SURFACE STRESS;

NANOCANTILEVERS; NATURAL FREQUENCIES; SPECTROSCOPY; SURFACE PROPERTIES;

ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;

EID: 84875610400     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.055210jes     Document Type: Article

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