Improved accuracy and speed in scanning probe microscopy by image reconstruction from non-gridded position sensor data

Nanotechnology

Volumn 24, Issue 33, 2013, Pages

  Ziegler, Dominik ^a   Meyer, Travis R ^b   Farnham, Rodrigo ^c   Brune, Christoph ^d   Bertozzi, Andrea L ^b   Ashby, Paul D ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c CALIFORNIA STATE UNIVERSITY   (United States)

^d UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHIMEDEAN SPIRAL; IMAGE PROCESSING TECHNIQUE; INDEPENDENT VARIABLES; NEW OPERATION MODES; NONDESTRUCTIVE CHARACTERIZATION; SCIENTIFIC DISCOVERY; SPATIAL RESOLUTION; SPECIFIC LOCATION;

IMAGE RECONSTRUCTION; IMAGE RESOLUTION; NONDESTRUCTIVE EXAMINATION; SENSORS;

SCANNING PROBE MICROSCOPY;

EID: 84881155389     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/33/335703     Document Type: Article

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