Magnetic scanning probe calibration using graphene hall sensor

IEEE Transactions on Magnetics

Volumn 49, Issue 7, 2013, Pages 3520-3523

  Panchal, Vishal ^a,b   Iglesias Freire, Óscar ^c   Lartsev, Arseniy ^d   Yakimova, Rositza ^e   Asenjo, Agustina ^c   Kazakova, Olga ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF LONDON   (United Kingdom)

^c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^d CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^e LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Epitaxial graphene; Hall sensor; Kelvin probe force microscopy (KPFM); magnetic probe calibration

Indexed keywords

EPITAXIAL GRAPHENE; FIELD INTERACTIONS; HALL SENSOR; KELVIN PROBE FORCE MICROSCOPY; MAGNETIC FORCE MICROSCOPIES (MFM); MAGNETIC PROBES; QUANTITATIVE MEASUREMENT; SCANNING GATE MICROSCOPY;

ELECTRIC FIELDS; EPITAXIAL GROWTH; GRAPHENE; HALL EFFECT TRANSDUCERS; MAGNETIC MATERIALS; MAGNETIC MOMENTS;

CALIBRATION;

EID: 84880816927     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2013.2243127     Document Type: Article

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