Measurement of the stray field emanating from magnetic force microscope tips by Hall effect microsensors

Journal of Applied Physics

Volumn 82, Issue 7, 1997, Pages 3182-3191

  Thiaville, A ^a   Belliard, L ^a   Majer, D ^b   Zeldov, E ^b   Miltat, J ^a  

^a UNIVERSITÉ PARIS SUD   (France)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CONFORMAL MAPPING; CURRENT DENSITY; HALL EFFECT DEVICES; LEAST SQUARES APPROXIMATIONS; MAGNETIC THIN FILMS; MAGNETIZATION; MATHEMATICAL MODELS; SENSORS; VECTORS;

CHARGE DEPLETION PHENOMENA; HALL EFFECT MICROSENSORS; HALL VOLTAGE MAPS; MAGNETIC FORCE MICROSCOPE; RESPONSE FUNCTION;

MAGNETIC FIELD MEASUREMENT;

EID: 0031244861     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365623     Document Type: Article

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