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Volumn 74, Issue 16, 2006, Pages

Classical Hall effect in scanning gate experiments

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EID: 33750470795     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.165426     Document Type: Article
Times cited : (26)

References (34)
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