Surface potential variations in epitaxial graphene devices investigated by Electrostatic Force Spectroscopy

Proceedings of the IEEE Conference on Nanotechnology

Volumn , Issue , 2012, Pages

  Panchal, Vishal ^a,b   Burnett, Tim L ^a,c   Pearce, Ruth ^a   Cedergren, Karin ^d   Yakimova, Rositza ^e   Tzalenchuk, Alexander ^a   Kazakova, Olga ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF LONDON   (United Kingdom)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

^d CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^e LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE LAYERS; ELECTRICAL FIELD; EPITAXIAL GRAPHENE; HALL DEVICES; HIGH SPATIAL RESOLUTION; METAL-COATED; POTENTIAL VARIATIONS; SCANNING KELVIN PROBE MICROSCOPY; SURFACE POTENTIAL MEASUREMENTS;

ELECTROSTATIC FORCE; EPITAXIAL GROWTH; GRAPHENE; NANOTECHNOLOGY; SILICON CARBIDE; WORK FUNCTION;

ELECTROSTATIC DEVICES;

EID: 84869200844     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2012.6322049     Document Type: Conference Paper

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