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Volumn 88, Issue 3, 2013, Pages

Electrostatic interactions with dielectric samples in scanning probe microscopies

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EID: 84880793996     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.88.035436     Document Type: Article
Times cited : (17)

References (22)
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    • Role of image forces in non-contact scanning force microscope images of ionic surfaces
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    • S. F. Lyuksyutov, R. A. Sharipov, G. Sigalov, and P. B. Paramonov, arXiv: cond-mat/0408247
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.