Image contrast in sum frequency generation microscopy based on monolayer order and coverage

Journal of Physical Chemistry C

Volumn 117, Issue 29, 2013, Pages 15192-15202

  Jang, Joon Hee ^a   Jacob, Jack ^a   Santos, Greggy ^a   Lee, T Randall ^a   Baldelli, Steven ^a  

^a University of Houston   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANETHIOL MONOLAYERS; CHEMICAL IDENTIFICATION; MICRO CONTACT PRINTING; NONLINEAR CURVE FIT; ORIENTATION ANGLES; SUM FREQUENCY GENERATION; SYMMETRIC RESONANCE; THREE DIMENSIONAL IMAGES;

ELECTRON DEVICE MANUFACTURE; FUNCTIONAL GROUPS; SELF ASSEMBLED MONOLAYERS;

CONFORMATIONS;

EID: 84880780587     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp404669j     Document Type: Article

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