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Volumn 113, Issue 13, 2013, Pages

Analysis of the series resistance in pin-type thin-film silicon solar cells

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE DENSITY OF STATE; EXPERIMENTAL DATUM; EXTERNAL RESISTANCE; HYDROGENATED SILICON; INTERNAL RESISTANCE; SERIES RESISTANCES; THIN FILM SILICON; THIN-FILM SILICON SOLAR CELLS;

EID: 84880689147     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4798393     Document Type: Conference Paper
Times cited : (27)

References (35)
  • 4
    • 84860299800 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.85.155201
    • W. Tress, K. Leo, and M. Riede, Phys. Rev. B 85, 155201 (2012). 10.1103/PhysRevB.85.155201
    • (2012) Phys. Rev. B , vol.85 , pp. 155201
    • Tress, W.1    Leo, K.2    Riede, M.3
  • 10
    • 76849110998 scopus 로고    scopus 로고
    • 10.1080/14786430903074805
    • R. Brüggemann, Philos. Mag. 89, 2519 (2009). 10.1080/ 14786430903074805
    • (2009) Philos. Mag. , vol.89 , pp. 2519
    • Brüggemann, R.1
  • 17
    • 84996236549 scopus 로고
    • 10.1080/14786437208226973
    • N. F. Mott, Philos. Mag. 26, 1015 (1972). 10.1080/14786437208226973
    • (1972) Philos. Mag. , vol.26 , pp. 1015
    • Mott, N.F.1
  • 18
  • 22


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.