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Volumn 16, Issue 44, 2004, Pages

Drift-mobility measurements and mobility edges in disordered silicons

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CARRIER MOBILITY; ELECTRONIC DENSITY OF STATES; HYDROGENATION; PARAMETER ESTIMATION; TEMPERATURE MEASUREMENT;

EID: 9244242067     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/44/023     Document Type: Conference Paper
Times cited : (38)

References (47)
  • 11
    • 9244225594 scopus 로고    scopus 로고
    • Doctoral Dissertation Freie Universität Berlin, unpublished
    • Dylla T 2004 Doctoral Dissertation Freie Universität Berlin, unpublished
    • (2004)
    • Dylla, T.1
  • 26
    • 0542381139 scopus 로고
    • ed M Pollak and B I Shklovskii (New York: Elsevier)
    • Monroe D 1991 Hopping Transport in Solids ed M Pollak and B I Shklovskii (New York: Elsevier) p 49
    • (1991) Hopping Transport in Solids , pp. 49
    • Monroe, D.1
  • 30
    • 9244234926 scopus 로고
    • Doctoral Dissertation Universität Stuttgart, unpublished
    • Nebel C E 1991 Doctoral Dissertation Universität Stuttgart, unpublished
    • (1991)
    • Nebel, C.E.1
  • 34
    • 9244261548 scopus 로고    scopus 로고
    • Doctoral Dissertation Syracuse University, unpublished
    • Rao P N 1999 Doctoral Dissertation Syracuse University, unpublished
    • (1999)
    • Rao, P.N.1
  • 43
    • 0002762318 scopus 로고
    • ed J D Joannopoulos and G Lucovsky (New York: Springer)
    • Tiedje T 1984 Hydrogenated Amorphous Silicon vol 2, ed J D Joannopoulos and G Lucovsky (New York: Springer) pp 261-300
    • (1984) Hydrogenated Amorphous Silicon , vol.2 , pp. 261-300
    • Tiedje, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.