Drift-mobility measurements and mobility edges in disordered silicons

Journal of Physics Condensed Matter

Volumn 16, Issue 44, 2004, Pages

  Schiff, E A ^a  

^a SYRACUSE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CARRIER MOBILITY; ELECTRONIC DENSITY OF STATES; HYDROGENATION; PARAMETER ESTIMATION; TEMPERATURE MEASUREMENT;

BANDTAIL DISTRIBUTIONS; BANDTAIL TRAPPING MODEL; DRIFT-MOBILITY MEASUREMENTS; MOBILITY EDGES;

AMORPHOUS SILICON;

EID: 9244242067     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/44/023     Document Type: Conference Paper

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