Quantification of segregation and mass transport in (formula presented) Stranski-Krastanow layers

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 24, 2001, Pages

  Rosenauer, A ^a   Gerthsen, D ^a   Dyck, D Van ^b   Arzberger, M ^c   Bohm G ^c   Abstreiter, G ^c  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF ANTWERP   (Belgium)

^c WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84880395643     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.245334     Document Type: Article

References (39)

1. Y. Arakawa and H. Sakaki, Appl. Phys. Lett.40, 939 (1982).
2. M. Grundmann, O. Stier, and D. Bimberg, Phys. Rev. B52, 11 969 (1995).
3. G. Fasol, Science275, 941 (1997).
4. J. Finley, M. Skalitz, M. Arzberger, A. Zrenner, G. Boehm, and G. Abstreiter, Appl. Phys. Lett.73, 2618 (1998).
5. J. Moison, C. Guille, F. Houzay, F. Barthe, and M V. Rompay, Phys. Rev. B40, 6149 (1989).
6. J. Nagle, J. Landesmann, M. Larive, C. Mottet, and P. Bois, J. Cryst. Growth127, 550 (1993).
7. D. McLean (Oxford University Press, Oxford, 1957).
8. K. Muraki, S. Fukatsu, Y. Shirakia, and R. Ito, Appl. Phys. Lett.61, 557 (1992).
9. O. Dehaese, X. Wallart, and F. Mollot, Appl. Phys. Lett.66, 52 (1995).
10. N. Grandjean, J. Massies, and M. Leroux, Phys. Rev. B53, 998 (1996).
11. R V G. Colayni, J. Cryst. Growth211, 21 (2000).
12. J.-M. Gerard, Appl. Phys. Lett.61, 2096 (1992).
13. J.-M. Gerard and G L. Roux, Appl. Phys. Lett.62, 3452 (1993).
14. H. Toyoshima, T. Niwa, J. Yamazaki, and A. Okamoto, Appl. Phys. Lett.63, 821 (1993).
15. H. Toyoshima, T. Niwa, J. Yamazaki, and A. Okamoto, J. Appl. Phys.75, 3908 (1994).
16. R. Kaspi and K. Evans, Appl. Phys. Lett.67, 819 (1995).
17. J. Garcia, J. Silveira, and F. Briones, Appl. Phys. Lett.77, 409 (2000).
18. L. Chu, M. Arzberger, G. Böhm, and G. Abstreiter, J. Appl. Phys.85, 2355 (1999).
19. I. Brodie and J. Muray, The Physics of Microfabrication (Plenum Press, New York, 1987).
20. A. Rosenauer, S. Kaiser, T. Reisinger, J. Zweck, W. Gebhardt, and D. Gerthsen, Optik (Stuttgart)102, 63 (1996).
21. W. Coene, A. Thust, M O. de Beeck, and D V. Dyck, Ultramicroscopy64, 109 (1996).
22. A. Rosenauer, D V. Dyck, M. Arzberger, and G. Abstreiter, Ultramicroscopy (to be published).
23. A. Rosenauer and D. Gerthsen, Adv. Imaging Electron Phys.107, 121 (1998).
24. PATRAN 7.0, MacNeal-Schwendler Corporation.
25. ABAQUS 5.5, Hibbitt, Karlsson & Sorenson Inc.
26. A. Rosenauer, U. Fischer, D. Gerthsen, and A. Förster, Ultramicroscopy72, 121 (1998).
27. A. Rosenauer and D. Gerthsen, Ultramicroscopy76, 49 (1999).
28. P. Stadelmann, Ultramicroscopy51, 131 (1987).
29. A. Rosenauer and D V. Dyck (unpublished).
30. A. Rosenauer, W. Oberst, D. Litvinov, D. Gerthsen, A. Förster, and R. Schmidt, Phys. Rev. B61, 8276 (2000).
31. O. Khreis, W. Gillin, and K. Homewood, Phys. Rev. B55, 15 813 (1997).
32. J. Tsang, C. Lee, S. Lee, K. Tsai, and H. Chen, J. Appl. Phys.77, 4302 (1995).
33. S. Rao, W. Gillin, and K. Homewood, Phys. Rev. B50, 8071 (1994).
34. R. Leon, D. Williams, J. Krueger, E. Weber, and M. Melloch, Phys. Rev. B56, R4336 (1997).
35. A. Rosenauer, U. Fischer, D. Gerthsen, and A. Förster, Appl. Phys. Lett.71, 3868 (1997).
36. P. Joyce, T. Krzyzewski, G. Bell, B. Joyce, and T. Jones, Phys. Rev. B58, R15 981 (1998).
37. I. Kegel, T. Metzger, A. Lorke, J. Peisl, J. Stangl, G. Bauer, J. Garcia, and P. Petroff, Phys. Rev. Lett.85, 1694 (2000).
38. P. Fry, Phys. Rev. Lett.84, 733 (2000).
39. H. Eisele, O. Flebbe, T. Kalka, C. Preinesberger, F. Heinrichsdorff, A. Krost, D. Bimberg, and M. Dähne-Prietsch, Appl. Phys. Lett.75, 106 (1999).