-
1
-
-
34547850370
-
-
10.1109/LED.2007.901273
-
W. Y. Choi, B. G. Park, J. D. Lee, and T. J. K. Liu, IEEE Electron Device Lett. 28, 743 (2007). 10.1109/LED.2007.901273
-
(2007)
IEEE Electron Device Lett.
, vol.28
, pp. 743
-
-
Choi, W.Y.1
Park, B.G.2
Lee, J.D.3
Liu, T.J.K.4
-
2
-
-
64549108830
-
-
10.1109/IEDM.2008.4796839
-
T. Krishnamohan, D. Kim, S. Raghunathan, and K. Saraswat, Tech. Dig.-Int. Electron Devices Meet. 2008, 947-949. 10.1109/IEDM.2008.4796839
-
Tech. Dig. - Int. Electron Devices Meet.
, vol.2008
, pp. 947-949
-
-
Krishnamohan, T.1
Kim, D.2
Raghunathan, S.3
Saraswat, K.4
-
3
-
-
19744366972
-
-
10.1103/PhysRevLett.93.196805
-
J. Appenzeller, Y. M. Lin, J. Knoch, and P. Avouris, Phys. Rev. Lett. 93, 196805 (2004). 10.1103/PhysRevLett.93.196805
-
(2004)
Phys. Rev. Lett.
, vol.93
, pp. 196805
-
-
Appenzeller, J.1
Lin, Y.M.2
Knoch, J.3
Avouris, P.4
-
4
-
-
79952947248
-
-
10.1063/1.3567021
-
A. C. Ford, C. W. Yeung, S. Chuang, H. S. Kim, E. Plis, S. Krishna, C. Hu, and A. Javey, Appl. Phys. Lett. 98, 113105 (2011). 10.1063/1.3567021
-
(2011)
Appl. Phys. Lett.
, vol.98
, pp. 113105
-
-
Ford, A.C.1
Yeung, C.W.2
Chuang, S.3
Kim, H.S.4
Plis, E.5
Krishna, S.6
Hu, C.7
Javey, A.8
-
5
-
-
77952338134
-
-
10.1109/IEDM.2009.5424355
-
S. Mookerjea, D. Mohata, R. Krishnan, J. Singh, A. Vallett, A. Ali, T. Mayer, V. Narayanan, D. Schlom, A. Liu, and S. Datta, Tech. Dig.-Int. Electron Devices Meet. 2009, 949-951. 10.1109/IEDM.2009.5424355
-
Tech. Dig. - Int. Electron Devices Meet.
, vol.2009
, pp. 949-951
-
-
Mookerjea, S.1
Mohata, D.2
Krishnan, R.3
Singh, J.4
Vallett, A.5
Ali, A.6
Mayer, T.7
Narayanan, V.8
Schlom, D.9
Liu, A.10
Datta, S.11
-
6
-
-
84863025233
-
-
10.1109/IEDM.2011.6131666
-
G. Dewey, B. Chu-Kung, J. Boardman, J. M. Fastenau, J. Kavalieros, R. Kotlyar, W. K. Liu, D. Lubyshev, M. Metz, N. Mukherjee, P. Oakey, R. Pillarisetty, M. Radosavljevic, H. W. Then, and R. Chau, Tech. Dig.-Int. Electron Devices Meet. 2011, 785-788. 10.1109/IEDM.2011.6131666
-
Tech. Dig. - Int. Electron Devices Meet.
, vol.2011
, pp. 785-788
-
-
Dewey, G.1
Chu-Kung, B.2
Boardman, J.3
Fastenau, J.M.4
Kavalieros, J.5
Kotlyar, R.6
Liu, W.K.7
Lubyshev, D.8
Metz, M.9
Mukherjee, N.10
Oakey, P.11
Pillarisetty, R.12
Radosavljevic, M.13
Then, H.W.14
Chau, R.15
-
7
-
-
78649451844
-
-
10.1109/LED.2010.2074178
-
H. Zhao, Y. Chen, Y. Wang, F. Zhou, F. Xue, and J. Lee, IEEE Electron Device Lett. 31, 1392 (2010). 10.1109/LED.2010.2074178
-
(2010)
IEEE Electron Device Lett.
, vol.31
, pp. 1392
-
-
Zhao, H.1
Chen, Y.2
Wang, Y.3
Zhou, F.4
Xue, F.5
Lee, J.6
-
8
-
-
77953025738
-
-
10.1109/LED.2010.2045631
-
S. Mookerjea, D. Mohata, T. Mayer, V. Narayanan, and S. Datta, IEEE Electron Device Lett. 31, 564 (2010). 10.1109/LED.2010.2045631
-
(2010)
IEEE Electron Device Lett.
, vol.31
, pp. 564
-
-
Mookerjea, S.1
Mohata, D.2
Mayer, T.3
Narayanan, V.4
Datta, S.5
-
9
-
-
84875158719
-
-
10.1063/1.4794536
-
B. Rajamohanan, D. Mohata, A. Ali, and S. Datta, Appl. Phys. Lett. 102, 092105 (2013). 10.1063/1.4794536
-
(2013)
Appl. Phys. Lett.
, vol.102
, pp. 092105
-
-
Rajamohanan, B.1
Mohata, D.2
Ali, A.3
Datta, S.4
-
10
-
-
84880344890
-
-
10.1109/IEDM.2012.6479154
-
G. L. Zhou, R. Li, T. Vasen, M. Qi, S. Chae, Y. Lu, Q. Zhang, H. Zhu, J. M. Kuo, T. Kosel, M. Wistey, P. Fay, A. Seabaugh, and H. L. Xing, IEEE Trans. Electron Devices 2012, 777-780. 10.1109/IEDM.2012.6479154
-
IEEE Trans. Electron Devices
, vol.2012
, pp. 777-780
-
-
Zhou, G.L.1
Li, R.2
Vasen, T.3
Qi, M.4
Chae, S.5
Lu, Y.6
Zhang, Q.7
Zhu, H.8
Kuo, J.M.9
Kosel, T.10
Wistey, M.11
Fay, P.12
Seabaugh, A.13
Xing, H.L.14
-
11
-
-
84862776915
-
-
10.1109/LED.2011.2179915
-
R. Li, Y. Q. Lu, G. L. Zhou, Q. M. Liu, S. D. Chae, T. Vasen, W. S. Hwang, Q. Zhang, P. Fay, T. Kosel, M. Wistey, H. L. Xing, and A. Seabaugh, IEEE Electron Device Lett. 33, 363 (2012). 10.1109/LED.2011.2179915
-
(2012)
IEEE Electron Device Lett.
, vol.33
, pp. 363
-
-
Li, R.1
Lu, Y.Q.2
Zhou, G.L.3
Liu, Q.M.4
Chae, S.D.5
Vasen, T.6
Hwang, W.S.7
Zhang, Q.8
Fay, P.9
Kosel, T.10
Wistey, M.11
Xing, H.L.12
Seabaugh, A.13
-
13
-
-
0035155619
-
-
10.1016/S0927-796X(00)00027-9
-
A. R. Clawson, Mater. Sci. Eng. 31, 1 (2001). 10.1016/S0927-796X(00) 00027-9
-
(2001)
Mater. Sci. Eng.
, vol.31
, pp. 1
-
-
Clawson, A.R.1
-
14
-
-
80755142755
-
-
10.1021/nl2030322
-
K. Takei, H. Fang, S. B. Kumar, R. Kapadia, Q. Gao, M. Madsen, H. S. Kim, C. H. Liu, Y. L. Chueh, E. Plis, S. Krishna, H. A. Bechtel, J. Guo, and A. Javey, Nano Lett. 11, 5008 (2011). 10.1021/nl2030322
-
(2011)
Nano Lett.
, vol.11
, pp. 5008
-
-
Takei, K.1
Fang, H.2
Kumar, S.B.3
Kapadia, R.4
Gao, Q.5
Madsen, M.6
Kim, H.S.7
Liu, C.H.8
Chueh, Y.L.9
Plis, E.10
Krishna, S.11
Bechtel, H.A.12
Guo, J.13
Javey, A.14
-
15
-
-
18344407454
-
-
10.1088/0268-1242/14/9/320
-
J. Mateos, T. Gonzalez, D. Pardo, V. Hoel, and A. Cappy, Semicond. Sci. Technol. 14, 864 (1999). 10.1088/0268-1242/14/9/320
-
(1999)
Semicond. Sci. Technol.
, vol.14
, pp. 864
-
-
Mateos, J.1
Gonzalez, T.2
Pardo, D.3
Hoel, V.4
Cappy, A.5
-
16
-
-
0028516350
-
-
10.1109/16.324581
-
Y. H. Wang, M. H. Liu, M. P. Houng, J. F. Chen, and A. Y. Cho, IEEE Trans. Electron Devices 41, 1734 (1994). 10.1109/16.324581
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, pp. 1734
-
-
Wang, Y.H.1
Liu, M.H.2
Houng, M.P.3
Chen, J.F.4
Cho, A.Y.5
|