Full spectrum photoluminescence lifetime analyses on silicon bricks

IEEE Journal of Photovoltaics

Volumn 3, Issue 3, 2013, Pages 962-969

  Mitchell, Bernhard ^a   Juhl, Mattias K ^a   Green, Martin A ^a   Trupke, Thorsten ^a,b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b BT Imaging   (Australia)

Author keywords

Bricks; carrier lifetime; imaging; ingot; photoluminescence; silicon; spectroscopy

Indexed keywords

LUMINESCENCE MEASUREMENTS; MULTI-CRYSTALLINE SILICON; PHOTOLUMINESCENCE LIFETIME; PHYSICAL MODELING; ROOM TEMPERATURE; SILICON BRICKS; SPECTRAL INTENSITY; SPECTRAL LUMINESCENCE;

CARRIER LIFETIME; IMAGING TECHNIQUES; INGOTS; MODELS; PHOTOLUMINESCENCE; SILICON; SPECTROSCOPY;

BRICK;

EID: 84880300075     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2259894     Document Type: Article

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