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Applied Physics Letters

Volumn 99, Issue 22, 2011, Pages

Evaluating the electrical properties of silicon wafer solar cells using hyperspectral imaging of luminescence

(6) Peloso, Matthew P a Sern Lew, Jen a Trupke, Thorsten b Peters, Marius a Utama, Roland c Aberle, Armin G a

a NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

b UNIVERSITY OF NEW SOUTH WALES (Australia)

c REC Wafer AS (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE PARAMETERS; DIFFUSION LENGTH; HYPERSPECTRAL; HYPERSPECTRAL IMAGING; LIGHT BEAM INDUCED CURRENTS; MULTICRYSTALLINE SILICON WAFERS; SPECTRAL SIGNATURE;

CHARGE CARRIERS; DIFFUSION; ELECTRIC PROPERTIES; INDUCED CURRENTS; LIGHT; LUMINESCENCE; NANOSTRUCTURED MATERIALS; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS;

SILICON WAFERS;

EID: 82955201548 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3664134 Document Type: Article

Times cited : (27)

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