Reconstruction of surface potential from Kelvin probe force microscopy images

Nanotechnology

Volumn 24, Issue 29, 2013, Pages

  Cohen, G ^a   Halpern, E ^a   Nanayakkara, S U ^b   Luther, J M ^b   Held, C ^c   Bennewitz, R ^c   Boag, A ^a   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGING EFFECT; GRAPHENE LAYERS; KELVIN PROBE FORCE MICROSCOPY; LINEAR SHIFT-INVARIANT SYSTEMS; NOISE STATISTICS; POINT-SPREAD FUNCTIONS; RECONSTRUCTION ALGORITHMS; WEIGHTED AVERAGES;

ALGORITHMS; AMPLITUDE MODULATION; CADMIUM SULFIDE; IMPULSE RESPONSE; INVARIANCE; NANORODS; OPTICAL TRANSFER FUNCTION; PROBES; SURFACE POTENTIAL;

IMAGE RECONSTRUCTION;

EID: 84879853549     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/29/295702     Document Type: Article

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