Atomic force microscopy of confined liquids using the thermal bending fluctuations of the cantilever

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 87, Issue 6, 2013, Pages

  Liu, Fei ^a   De Beer, Sissi ^a   Van Den Ende, Dirk ^a   Mugele, Frieder ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER EXCITATION; EXCITATION AMPLITUDES; HIGHLY ORIENTED PYROLYTIC GRAPHITE; HYDRODYNAMIC COUPLING; INTERACTION LENGTH; NON-MONOTONIC VARIATION; OCTAMETHYLCYCLOTETRASILOXANE; TIP-SUBSTRATE SEPARATION;

ATOMIC FORCE MICROSCOPY; LIQUID FILMS; SUBSTRATES;

NANOCANTILEVERS;

OCTAMETHYLCYCLOTETRASILOXANE; SILOXANE; SOLUTION AND SOLUBILITY;

ATOMIC FORCE MICROSCOPY; CHEMISTRY; HARDNESS; HEAT; MATERIALS TESTING; PROCEDURES; SOLUTION AND SOLUBILITY; SURFACE PROPERTY; YOUNG MODULUS;

ELASTIC MODULUS; HARDNESS; HOT TEMPERATURE; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; SILOXANES; SOLUTIONS; SURFACE PROPERTIES;

EID: 84879808289     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.87.062406     Document Type: Article

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