Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy - Magnetic vs. dither piezo excitation

Journal of Applied Physics

Volumn 111, Issue 5, 2012, Pages

  Xu, Xin ^a   Koslowski, Marisol ^a   Raman, Arvind ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITATION MODE; FORCE MODULATION; LOCAL MECHANICAL PROPERTIES; LOW FREQUENCY; MAGNETIC MODES; MATERIAL PROPERTY; MICRO-CANTILEVERS; NANOSCALE MECHANICAL PROPERTIES; PHASE DISTORTIONS; QUANTITATIVE MAPPING; RESONANCE PEAK;

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; DYNAMICS; FREQUENCY RESPONSE; MECHANICAL PROPERTIES;

COMPOSITE MICROMECHANICS;

EID: 84858957283     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3689815     Document Type: Article

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