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Volumn 5, Issue 11, 2013, Pages 5086-5092

Copper silicide/silicon nanowire heterostructures: In situ TEM observation of growth behaviors and electron transport properties

Author keywords

[No Author keywords available]

Indexed keywords

DIMENSIONAL STACKING; DYNAMIC DIFFUSION; ELECTRICAL TRANSPORT PROPERTIES; FORMATION MECHANISM; HETEROSTRUCTURE INTERFACES; IN-SITU TRANSMISSION; INTERFACE PROPERTY; NANOWIRE HETEROSTRUCTURES;

EID: 84878130524     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c3nr33302g     Document Type: Article
Times cited : (35)

References (44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.