In situ electron microscopy of the phases of Cu3Si

Philosophical Magazine

Volumn 87, Issue 35, 2007, Pages 5581-5599

  Wen, C Y ^a   Spaepen, F ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IN SITU PROCESSING; PHASE TRANSITIONS; PRECIPITATES; TRANSMISSION ELECTRON MICROSCOPY;

FAULTED STACKING; SILICON MATRIX;

COPPER COMPOUNDS;

EID: 36248971148     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701675829     Document Type: Article

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