Cs-corrected scanning transmission electron microscopy investigation of dislocation core configurations at a SrTiO3/MgO heterogeneous interface

Microscopy and Microanalysis

Volumn 19, Issue 3, 2013, Pages 706-715

  Zhu, Yuanyuan ^a   Song, Chengyu ^b   Minor, Andrew M ^b,c   Wang, Haiyan ^a,d  

^a TEXAS A AND M UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c University of California Berkeley   (United States)

^d Department of Electrical and Computer Engineering   (United States)

Author keywords

aberration corrected scanning transmission electron microscopy (Cs corrected STEM); dislocation core; geometric phase analysis (GPA); interface structure; perovskite; thin films

Indexed keywords

EID: 84877967753     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927613000408     Document Type: Article

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