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Applied Physics Letters

Volumn 102, Issue 15, 2013, Pages

Reversible post-breakdown conduction in aluminum oxide-polymer capacitors

(5) Chen, Qian a,b Gomes, Henrique L a,b Rocha, Paulo R F a,b De Leeuw, Dago M c Meskers, Stefan C J d

a INSTITUTO DE TELECOMUNICAÇÕES (Portugal)

b UNIVERSITY OF ALGARVE (Portugal)

c MAX PLANCK INSTITUTE FOR POLYMER RESEARCH (Germany)

d EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED DEFECTS; CONSTANT CURRENT STRESS; INSULATING PROPERTIES; LOW POWER; RESISTIVE SWITCHING; SELF-HEALING;

CAPACITORS; ELECTRIC FIELDS; PHOTOEXCITATION;

POLYMERS;

EID: 84877119792 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4802485 Document Type: Article

Times cited : (4)

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