Probing charge carrier density in a layer of photodoped ZnO nanoparticles by spectroscopic ellipsometry

Journal of Physical Chemistry C

Volumn 114, Issue 35, 2010, Pages 14804-14810

  Lakhwani, Girish ^a   Roijmans, Roel F H ^a   Kronemeijer, Auke J ^a   Gilot, Jan ^b   Janssen, René A J ^a   Meskers, Stefan C J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIER DENSITY; ETHYLENEDIOXYTHIOPHENES; FREE CARRIER DENSITY; KELVIN PROBE MEASUREMENTS; LOWER LIMITS; MOSS-BURSTEIN SHIFT; OPTICAL ABSORPTION; P-TYPE; PHOTON ENERGY; UV ILLUMINATIONS; ZNO; ZNO NANOPARTICLES;

CARRIER CONCENTRATION; ELECTRON MOBILITY; NANOPARTICLES; OHMIC CONTACTS; OPTICAL CONSTANTS; SPECTROSCOPIC ELLIPSOMETRY;

ZINC OXIDE;

EID: 79951594248     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp104846h     Document Type: Article

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