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Volumn 1, Issue 14, 2013, Pages 2593-2598

Correlation of diffusion and performance in sequentially processed P3HT/PCBM heterojunction films by time-resolved neutron reflectometry

(7) Lee, Kwan H a Zhang, Yuliang a Burn, Paul L a Gentle, Ian R a James, Michael b,c Nelson, Andrew b Meredith, Paul a

a UNIVERSITY OF QUEENSLAND (Australia)

b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION (Australia)

c UNIVERSITY OF NEW SOUTH WALES (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; BULK HETEROJUNCTION; NEUTRON REFLECTOMETRY; POWER CONVERSION EFFICIENCIES; RAPID INTERDIFFUSION; SOLUTION PROCESSABLE; SPIN-COATED THIN FILMS; TWO-LAYER STRUCTURES;

ANNEALING; FILM PREPARATION; NEUTRON REFLECTION; SOLIDS;

HETEROJUNCTIONS;

EID: 84876935234 PISSN: 20507534 EISSN: 20507526 Source Type: Journal
DOI: 10.1039/c3tc00063j Document Type: Article

Times cited : (38)

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