A quantitative study of PCBM diffusion during annealing of P3HT: PCBM blend films

Macromolecules

Volumn 42, Issue 21, 2009, Pages 8392-8397

  Watts, Benjamin ^a,c   Belcher, Warwick J ^b   Thomsen, Lars ^b,d   Ade, Harald ^a   Dastoor, Paul C ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF NEWCASTLE   (Australia)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d AUSTRALIAN SYNCHROTRON   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; BLEND FILMS; CONCENTRATION PROFILES; CRYSTAL BOUNDARY; DIFFUSION CONSTANT; FICK'S SECOND LAW; MDMO-PPV; QUANTITATIVE STUDY; SCANNING TRANSMISSION X RAY MICROSCOPY; TEMPERATURE PHASE;

ANNEALING; CRYSTALS; PHASE DIAGRAMS;

DIFFUSION;

EID: 70449365826     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma901444u     Document Type: Article

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